Stroke -- Index by Author (Feb 1996; Volume 27, Number 2)

Index by Author: Feb 1996; 27 (2) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

A: Alexandrov, Andrei V. [Abstract] [Full Text]; Ameri, Alain [Abstract] [Full Text]; Archie, Joseph P. [Full Text]; Åström, Monica [Abstract] [Full Text]
B: Baker, William H. [Full Text]; Barnes, Robert W. [Full Text]; Bartels, Eva [Abstract] [Full Text]; Becker, Gary J. [Full Text]; Beebe, Hugh G. [Full Text]; Berger, Klaus [Abstract] [Full Text]; Bernstein, Eugene F. [Full Text]; Blomstrand, Christian [Abstract] [Full Text]; Bonasso, Christian L. [Abstract] [Full Text]; Borhani, Nemat O. [Abstract] [Full Text]; Bousser, Marie-Germaine [Abstract] [Full Text]; Brener, Bruce [Full Text]; Buring, Julie E. [Abstract] [Full Text]; Buschmann, Hans-Christian [Abstract] [Full Text]
C: Casey, Robyn M. [Abstract] [Full Text]; Clagett, G. Patrick [Full Text]; Clowes, Alexander W. [Full Text]; Cooke, John P. [Full Text]; Creager, Mark A. [Full Text]; Cronenwett, Jack L. [Full Text]
D: Dake, Michael [Full Text]; Daviglus, Martha L. [Abstract] [Full Text]; Day, Arthur L. [Abstract] [Full Text]; DeWeese, James A. [Full Text]; Dexter, Franklin [Abstract] [Full Text]; Dyer, Alan R. [Abstract] [Full Text]
E: Edelmann, Michael [Abstract] [Full Text]
F: Flügel, K.A. [Abstract] [Full Text]; Fogarty, Thomas J. [Full Text]; Freischlag, Julie A. [Full Text]; Fujii, Kenichiro [Abstract] [Full Text]; Fujishima, Masatoshi [Abstract] [Full Text]; Furberg, Curt D. [Abstract] [Full Text]
G: Gallagher, T. James [Abstract] [Full Text]; Gardin, Julius M. [Abstract] [Full Text]; Gelber, David [Abstract] [Full Text]; Georgiadis, Dimitrios [Abstract] [Full Text]; Goldstone, Jerry [Full Text]; Good, David C. [Abstract] [Full Text]; Greenfield, Lazar J. [Full Text]; Gymnopoulos, Constantinos [Abstract] [Full Text]
H: Henkle, Joseph Q. [Abstract] [Full Text]; Hertzer, Norman R. [Full Text]; Hindman, Bradley J. [Abstract] [Full Text]; Hobson, Robert W. [Full Text]
I: Iadecola, Costantino [Abstract] [Full Text]; Ibayashi, Setsuro [Abstract] [Full Text]; Itoh, Yoshinori [Abstract] [Full Text]
J: Johansson, Barbro B. [Abstract] [Full Text]; Jousilahti, Pekka [Abstract] [Full Text]; Joyce, John W. [Full Text]
K: Kaasik, Ain-Elmar [Abstract] [Full Text]; Karasawa, Jun [Abstract] [Full Text]; Kase, Carlos S. [Abstract] [Full Text]; Katzen, Barry T. [Full Text]; Kittner, Steven J. [Abstract] [Full Text]; Kôrv, Janika [Abstract] [Full Text]; Kronmal, Richard A. [Abstract] [Full Text]
L: Layon, A. Joseph [Abstract] [Full Text]; Lewis, Adam I. [Abstract] [Full Text]; LoGerfo, Frank W. [Full Text]
M: Matsushita, Masaaki [Abstract] [Full Text]; Meslin, Eric M. [Abstract] [Full Text]; Mohr, J.P. [Full Text]; Moore, Wesley S. [Full Text]; Müller, M. [Abstract] [Full Text]
N: Nabavi, Darius G. [Abstract] [Full Text]; Najafi, Hassan [Full Text]; Naver, Hans K. [Abstract] [Full Text]; Norris, John W. [Abstract] [Full Text]
O: O'Leary, Daniel H. [Abstract] [Full Text]; Ohnishi, Hideyuki [Abstract] [Full Text]; Orencia, Anthony J. [Abstract] [Full Text]; Otomo, Eiichi [Abstract] [Full Text]
P: Piantadosi, Claude A. [Abstract] [Full Text]; Polak, Joseph F. [Abstract] [Full Text]; Preter, Maurice [Abstract] [Full Text]; Price, Thomas R. [Abstract] [Full Text]; Pullicino, Patrick M. [Abstract] [Full Text]
R: Ramadan, Nabih M. [Abstract] [Full Text]; Rapoport, Robert M. [Abstract] [Full Text]; Rastenyte, Daiva [Abstract] [Full Text]; Reasoner, Daniel K. [Abstract] [Full Text]; Ricotta, John J. [Full Text]; Riles, Thomas S. [Full Text]; Ring, Ernest J. [Full Text]; Ringelstein, E. Bernd [Abstract] [Full Text]; Robertson, James [Full Text]; Roose, Mai [Abstract] [Full Text]; Ross, M. Elizabeth [Abstract] [Full Text]; Rothwell, P.M. [Abstract] [Full Text]; Rothwell, P.M. [Abstract] [Full Text]; Rutherford, Robert B. [Full Text]; Ryu, Keon Hee [Abstract] [Full Text]
S: Sarti, Cinzia [Abstract] [Full Text]; Savage, Peter J. [Abstract] [Full Text]; Schick, Achim [Abstract] [Full Text]; Schimrigk, K. [Abstract] [Full Text]; Shekelle, Richard B. [Abstract] [Full Text]; Slattery, J. [Abstract] [Full Text]; Slattery, J. [Abstract] [Full Text]; Sos, Thomas [Full Text]; Sperelakis, Nicholas [Abstract] [Full Text]; Stachniak, Joseph B. [Abstract] [Full Text]; Stamler, Jeremiah [Abstract] [Full Text]; Stanley, James C. [Full Text]; Strandness, D. Eugene [Full Text]; Suematsu, Naomi [Abstract] [Full Text]; Sugimori, Hiroshi [Abstract] [Full Text]; Sumner, David S. [Full Text]
T: Toole, James [Full Text]; Touho, Hajime [Abstract] [Full Text]; Towne, Jonathan B. [Full Text]; Tracy, Russell [Abstract] [Full Text]; Tuomilehto, Jaakko [Abstract] [Full Text]; Tzourio, Christophe [Abstract] [Full Text]
V: Vartiainen, Erkki [Abstract] [Full Text]; Veith, Frank J. [Full Text]; Verhulst, Steve [Abstract] [Full Text]
W: Wallin, B. Gunnar [Abstract] [Full Text]; Warlow, C.P. [Abstract] [Full Text]; Warlow, C.P. [Abstract] [Full Text]; Welsh, Jennifer [Abstract] [Full Text]; Whittemore, Anthony D. [Full Text]
Y: Yamada, Masahito [Abstract] [Full Text]; Yao, Hiroshi [Abstract] [Full Text]; Yao, James S.T. [Full Text]
Z: Zarins, Christopher K. [Full Text]; Zhang, Fangyi [Abstract] [Full Text]; Zhang, Jing [Abstract] [Full Text]; Zuccarello, Mario [Abstract] [Full Text]; Zunker, Peter [Abstract] [Full Text]